• DocumentCode
    1518961
  • Title

    Exploiting electro-thermal resonance in high voltage power bipolar devices

  • Author

    D´Amore, D. ; Maffezzoni, P.

  • Author_Institution
    Dipt. di Elettronica, Politecnico di Milano, Italy
  • Volume
    35
  • Issue
    7
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    600
  • Lastpage
    602
  • Abstract
    It is theoretically and experimentally proven that the fast heating mechanism that takes place in high voltage power bipolar transistors can be coupled with the electrical dynamics to obtain stable electro-thermal oscillations. Finding such a resonance condition allows the experimental extraction of fast thermal transient parameter values
  • Keywords
    equivalent circuits; oscillations; power bipolar transistors; resonance; semiconductor device models; thermal analysis; thermal resistance; HV power bipolar devices; electrical dynamics; electro-thermal resonance; fast heating mechanism; fast thermal transient parameter values; high voltage bipolar transistors; resonance condition; stable electro-thermal oscillations;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19990372
  • Filename
    769509