DocumentCode :
1518965
Title :
On the Relation Between Stored Energy and Fabrication Tolerances in Microwave Filters
Author :
Martinez-Mendoza, Monica ; Ernst, Christoph ; Lorente, Jose Antonio ; Alvarez-Melcon, Alejandro ; Seyfert, Fabien
Author_Institution :
Inst. de Telecomun. y Aplic. Multimedia (iTEAM), Univ. Politec. de Valencia, Valencia, Spain
Volume :
60
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
2131
Lastpage :
2141
Abstract :
In this paper, a new approach for the sensitivity analysis of microwave filter networks is presented. It is shown that the standard method of sensitivity calculation based on a tuned filter is only valid for infinitesimal geometry changes and not meaningful for practical tolerance values. However, when the sensitivity calculation is expanded to also include sensitivities of detuned filters, it is shown that accurate tolerance predictions can be made even for large geometry variations. It is found that sensitivities can be related to the stored energy distribution in the filter. Transversal and ladder network-type topologies are examined, and it is demonstrated for the first time that, for in-line topologies, sensitivity can be predicted directly from the group delay of the filter in Chebyshev filters. In order to demonstrate the usefulness of the results obtained, the maximum degradation of the in-band performance has been directly obtained from the group delay for different inline filters.
Keywords :
Chebyshev filters; geometry; microwave filters; sensitivity analysis; Chebyshev filters; detuned filters; fabrication tolerances; geometry variations; group delay; inband performance; infinitesimal geometry; inline filters; inline topologies; ladder network-type topologies; microwave filter networks; sensitivity analysis; standard method; stored energy distribution; tolerance predictions; transversal network-type topologies; tuned filter; Couplings; Delay; Energy storage; Microwave filters; Resonant frequency; Sensitivity; Topology; Bandpass filters; resonator filters; sensitivity; tolerance analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2012.2195023
Filename :
6202390
Link To Document :
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