Title :
Analysis of sharp metal edges at 45° to the FDTD grid
Author :
Esselle, Karu P. ; Okoniewski, Michal ; Stuchly, Maria A.
Author_Institution :
Dept. of Electron., Macquarie Univ., Sydney, NSW, Australia
fDate :
6/1/1999 12:00:00 AM
Abstract :
New finite-difference time-domain (FDTD) update equations for sharp metal edges are presented. The edge is assumed to be diagonal to the Yee cell faces. Derived using the contour-path method, the new equations properly model the singular field near the edge even with a relatively coarse grid. A dramatic improvement in computed accuracy was observed when a stripline with two sharp edges was analyzed using the new equations instead of standard FDTD techniques. The new equations are found to be stable even with the maximum allowed time step, easy to implement, and do not increase computer memory and time requirements
Keywords :
electromagnetic field theory; finite difference time-domain analysis; microstrip lines; numerical stability; strip lines; FDTD grid; FDTD update equations; Yee cell faces; contour-path method; finite-difference time-domain method; sharp metal edges; singular field modelling; stripline; Computational modeling; Councils; Electromagnetic fields; Equations; Finite difference methods; Magnetic field measurement; Microstrip; Stripline; Strips; Time domain analysis;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
