Title :
Properties of the embedded transmission line (ETL)-an offset stripline with two dielectrics
Author :
Darwish, Ali ; Ezzeddine, Amin ; Huang, Ho C. ; Mah, Misoon
Author_Institution :
AMCOM Commun. Inc., Clarksburg, MD, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
In three-dimensional (3-D) circuits that employ multilevel metallization, a frequently encountered transmission line configuration is the embedded transmission line (ETL), which is essentially an offset stripline topology with two dielectrics. There is no closed-form expression available for either the characteristic impedance or effective dielectric constant, since the problem is analytically complex for an exact analysis. This work provides an approximate empirical formula for both the effective dielectric constant and the characteristic impedance, and compares them with full-wave simulations of the structure. A few percent error (typically, less than 3% for Z0, and 5% for εeff) is observed over a wide range of transmission line parameters
Keywords :
MMIC; electric impedance; permittivity; strip line circuits; strip lines; transmission line theory; 3D circuits; approximate empirical formula; characteristic impedance; dielectric layers; effective dielectric constant; embedded transmission line; multilevel metallization; offset stripline topology; three-dimensional circuits; Dielectric constant; Dielectric thin films; Distributed parameter circuits; Gallium arsenide; Impedance; Microstrip; Polyimides; Stripline components; Transmission line theory; Transmission lines;
Journal_Title :
Microwave and Guided Wave Letters, IEEE