DocumentCode :
1519122
Title :
Synthesis of modular mechatronic products: a testability perspective
Author :
Huang, Chun-Che ; Kusiak, Andrew
Author_Institution :
Dept. of Ind. Manage., Nat. Chi-Nan Univ., Puli, Taiwan
Volume :
4
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
119
Lastpage :
132
Abstract :
Producing modular products that combine modules with the consideration of product performance, e.g., testability of electronic systems, is frequently stated as a design goal. However, most of mechatronic frameworks (models) discussed in the literature do not consider testability of electronic subsystems of mechatronic products. This paper assumes that the product modules have been established, and aims at the development of modular mechatronic products with the consideration of testability of electronic subsystems as a performance criterion. The generation of modular products and module testability issues are discussed. Testability points, testability values, and access paths for a module/system are crucial to the generation of modular mechatronic products. A generalized label-correcting algorithm is developed to determine the points of focus, testability values, and access paths in modules
Keywords :
electronic equipment testing; mechatronics; modules; product development; electronic systems; label-correcting algorithm; modular mechatronic products; performance criterion; product synthesis; testability; Assembly; Circuit testing; Costs; Economies of scale; Electronic equipment testing; Integrated circuit testing; Intelligent systems; Laboratories; Mechatronics; System testing;
fLanguage :
English
Journal_Title :
Mechatronics, IEEE/ASME Transactions on
Publisher :
ieee
ISSN :
1083-4435
Type :
jour
DOI :
10.1109/3516.769539
Filename :
769539
Link To Document :
بازگشت