DocumentCode :
1519296
Title :
About the existing discrepancy in the determinations of the Avogadro constant
Author :
Martin, Jens ; Bettin, Horst ; Kuetgens, Ulrich ; Schiel, Detlef ; Becker, Peter
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Volume :
48
Issue :
2
fYear :
1999
fDate :
4/1/1999 12:00:00 AM
Firstpage :
216
Lastpage :
220
Abstract :
The values for the Avogadro constant NA, derived from lattice spacing, density, and molar mass of silicon single crystals at several metrological institutes, show significant differences. To illuminate this discrepancy, comparison measurements of lattice spacing and density were performed. Positron annihilation measurements were used to estimate the vacancy concentration in Si samples. All crystals lead to nearly the same lattice spacing after correction for the influence of carbon and oxygen impurities. It is proved that the discrepancy in the determinations of the Avogadro constant cannot be explained by vacancies or interstitials. Also indications for macroscopic bubbles or cavities could not be found
Keywords :
constants; density; impurities; interstitials; silicon; vacancies (crystal); voids (solid); Avogadro constant; C impurities; O impurities; Si; Si single crystals; density; determination discrepancy; flotation measurements; interstitials; lattice spacing; metrological institutes; molar mass; positron annihilation measurements; vacancy concentration; Atomic measurements; Crystals; Density measurement; Helium; Impurities; Lattices; Microscopy; Performance evaluation; Positrons; Silicon;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.769567
Filename :
769567
Link To Document :
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