• DocumentCode
    1519331
  • Title

    The molar volume of silicon: discrepancies and limitations

  • Author

    Deslattes, Richard D. ; Kessler, Ernest G., Jr.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    48
  • Issue
    2
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    238
  • Lastpage
    241
  • Abstract
    We offer a new representation of the silicon molar volume discrepancy by attending to a previously incorrect accounting of the early work at the National Bureau of Standards (NBS). Removal of a poorly documented correction to the NBS density scale leads to a plausibly correct description of the molar volume anomaly problem. The possibility of discrepant metrology has been previously ruled out by sample exchanges. This led to several materials characterization exercises that gave important null results as briefly summarized here. We report the first non-null results and examine their correlation with those samples with discrepant molar volume values. In the end, there is a reasonably optimistic prospect that concordant and accurate density values can emerge at an interesting level of significance (less than 10 -7). A brief discussion of intrinsic limitations of melt-grown crystals is included
  • Keywords
    X-ray diffraction; constants; density; measurement standards; silicon; Avogadro constant determination; NBS density scale; National Bureau of Standards; Si; Si molar volume; melt-grown crystals; molar volume discrepancy; silicon kilogram; Crystals; Density measurement; Europe; Laboratories; Measurement errors; Metrology; NIST; Silicon; Surfaces; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.769572
  • Filename
    769572