DocumentCode
1519343
Title
Voltage and Temperature Aware Statistical Leakage Analysis Framework Using Artificial Neural Networks
Author
Janakiraman, V. ; Bharadwaj, Amrutur ; Visvanathan, V.
Author_Institution
Dept. of Electr. & Commun. Eng., Indian Inst. of Sci., Bangalore, India
Volume
29
Issue
7
fYear
2010
fDate
7/1/2010 12:00:00 AM
Firstpage
1056
Lastpage
1069
Abstract
Artificial neural networks (ANNs) have shown great promise in modeling circuit parameters for computer aided design applications. Leakage currents, which depend on process parameters, supply voltage and temperature can be modeled accurately with ANNs. However, the complex nature of the ANN model, with the standard sigmoidal activation functions, does not allow analytical expressions for its mean and variance. We propose the use of a new activation function that allows us to derive an analytical expression for the mean and a semi-analytical expression for the variance of the ANN-based leakage model. To the best of our knowledge this is the first result in this direction. Our neural network model also includes the voltage and temperature as input parameters, thereby enabling voltage and temperature aware statistical leakage analysis (SLA). All existing SLA frameworks are closely tied to the exponential polynomial leakage model and hence fail to work with sophisticated ANN models. In this paper, we also set up an SLA framework that can efficiently work with these ANN models. Results show that the cumulative distribution function of leakage current of ISCAS´85 circuits can be predicted accurately with the error in mean and standard deviation, compared to Monte Carlo-based simulations, being less than 1% and 2% respectively across a range of voltage and temperature values.
Keywords
CAD; Monte Carlo methods; leakage currents; neural nets; statistical analysis; ANN model; ANN-based leakage model; ISCAS 85 circuits; Monte Carlo-based simulations; SLA framework; activation function; artificial neural networks; circuit modeling; computer aided design applications; exponential polynomial leakage model; leakage currents; process parameters; standard deviation; standard sigmoidal activation functions; supply voltage; temperature aware statistical leakage analysis; temperature modeling; voltage aware statistical leakage analysis; Analysis of variance; Application software; Artificial neural networks; Circuits; Computer applications; Computer networks; Leakage current; Temperature dependence; Temperature distribution; Voltage; Activation; leakage; log-normal; neural network; sigmoid; statistical;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2010.2049059
Filename
5487472
Link To Document