Thermoelectric transfer difference of thermal converters measured with a Josephson source

Author

Burroughs, Charles J., Jr. ; Benz, Samuel P. ; Hamilton, Clark A. ; Harvey, Todd E. ; Kinard, Joseph R. ; Lipe, Thomas E. ; Sasaki, Hitoshi

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO, USA

Volume

48

Issue

2

fYear

1999

fDate

4/1/1999 12:00:00 AM

Firstpage

282

Lastpage

284

Abstract

We have measured the thermoelectric transfer difference of two thermal voltage converters using a Josephson source and compared the results to similar measurements made with a conventional semiconductor source. Both sources use the fast reversed dc method. The Josephson source is an array of 16 384 superconductor-normal-superconductor Josephson junctions that is rapidly switched between voltage states of +0.5, 0, and -0.5 V. A marginally significant difference is detected between measurements with the two different sources

Keywords

Josephson effect; convertors; measurement standards; measurement uncertainty; superconductor-normal-superconductor devices; voltage measurement; -0.5 to 0.5 V; Josephson source; fast reversed dc method; superconductor-normal-superconductor Josephson junctions; thermal converters; thermoelectric transfer difference; voltage states; Digital-analog conversion; Fluctuations; Josephson junctions; Measurement techniques; Metrology; NIST; Superconducting devices; Switches; Thermoelectricity; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.769583

Filename

769583