• DocumentCode
    151942
  • Title

    Dual chamber transmission/reflection method for high temperature electromagnetic material characterization

  • Author

    Bogle, Andrew E. ; Havrilla, Michael J. ; Hyde, Milo W.

  • Author_Institution
    Univ. of Dayton Res. Inst., Dayton, OH, USA
  • fYear
    2014
  • fDate
    6-11 July 2014
  • Firstpage
    14
  • Lastpage
    14
  • Abstract
    The ability to determine the electromagnetic properties of materials at high temperatures has applications in the industrial, aerospace, defense and scientific communities. Currently, the industry standard method requires two levels of calibration, an initial thru-reect-line calibration of the room temperature section followed by a Tier II (short, empty) response calibration of the high temperature section, in order to extract the desired permittivity and permeability values at high temperatures. This technique requires three measurements (short, empty and sample) at the desired temperatures, thus requiring three days to perform measurements due to inherent thermal constraints.
  • Keywords
    electromagnetic wave reflection; electromagnetic wave transmission; Tier II; dual chamber reflection method; dual chamber transmission method; electromagnetic properties; high temperature electromagnetic material characterization; high temperature section; industry standard method; thru-reect-line calibration; Calibration; Electromagnetics; Materials; Permittivity measurement; Position measurement; Temperature; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Science Meeting (Joint with AP-S Symposium), 2014 USNC-URSI
  • Conference_Location
    Memphis, TN
  • Type

    conf

  • DOI
    10.1109/USNC-URSI.2014.6955396
  • Filename
    6955396