DocumentCode :
151942
Title :
Dual chamber transmission/reflection method for high temperature electromagnetic material characterization
Author :
Bogle, Andrew E. ; Havrilla, Michael J. ; Hyde, Milo W.
Author_Institution :
Univ. of Dayton Res. Inst., Dayton, OH, USA
fYear :
2014
fDate :
6-11 July 2014
Firstpage :
14
Lastpage :
14
Abstract :
The ability to determine the electromagnetic properties of materials at high temperatures has applications in the industrial, aerospace, defense and scientific communities. Currently, the industry standard method requires two levels of calibration, an initial thru-reect-line calibration of the room temperature section followed by a Tier II (short, empty) response calibration of the high temperature section, in order to extract the desired permittivity and permeability values at high temperatures. This technique requires three measurements (short, empty and sample) at the desired temperatures, thus requiring three days to perform measurements due to inherent thermal constraints.
Keywords :
electromagnetic wave reflection; electromagnetic wave transmission; Tier II; dual chamber reflection method; dual chamber transmission method; electromagnetic properties; high temperature electromagnetic material characterization; high temperature section; industry standard method; thru-reect-line calibration; Calibration; Electromagnetics; Materials; Permittivity measurement; Position measurement; Temperature; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Science Meeting (Joint with AP-S Symposium), 2014 USNC-URSI
Conference_Location :
Memphis, TN
Type :
conf
DOI :
10.1109/USNC-URSI.2014.6955396
Filename :
6955396
Link To Document :
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