DocumentCode
151942
Title
Dual chamber transmission/reflection method for high temperature electromagnetic material characterization
Author
Bogle, Andrew E. ; Havrilla, Michael J. ; Hyde, Milo W.
Author_Institution
Univ. of Dayton Res. Inst., Dayton, OH, USA
fYear
2014
fDate
6-11 July 2014
Firstpage
14
Lastpage
14
Abstract
The ability to determine the electromagnetic properties of materials at high temperatures has applications in the industrial, aerospace, defense and scientific communities. Currently, the industry standard method requires two levels of calibration, an initial thru-reect-line calibration of the room temperature section followed by a Tier II (short, empty) response calibration of the high temperature section, in order to extract the desired permittivity and permeability values at high temperatures. This technique requires three measurements (short, empty and sample) at the desired temperatures, thus requiring three days to perform measurements due to inherent thermal constraints.
Keywords
electromagnetic wave reflection; electromagnetic wave transmission; Tier II; dual chamber reflection method; dual chamber transmission method; electromagnetic properties; high temperature electromagnetic material characterization; high temperature section; industry standard method; thru-reect-line calibration; Calibration; Electromagnetics; Materials; Permittivity measurement; Position measurement; Temperature; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Science Meeting (Joint with AP-S Symposium), 2014 USNC-URSI
Conference_Location
Memphis, TN
Type
conf
DOI
10.1109/USNC-URSI.2014.6955396
Filename
6955396
Link To Document