• DocumentCode
    1519458
  • Title

    Evaluation of guarded high-resistance Hamon transfer standards

  • Author

    Jarrett, Dean G.

  • Author_Institution
    Electr. & Electron. Eng. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    48
  • Issue
    2
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    324
  • Lastpage
    328
  • Abstract
    An improved design for a guarded transfer standard in the resistance range 1 MΩ to 100 GΩ is described. Existing transfer standards and their limitations are reviewed along with a description of guard circuit theory. Measurements made to evaluate the effectiveness of guard networks are described and results are reported that verify the guard circuit behaviour. Guarded transfer standards have been tested with internal and external guard networks showing the benefits of guarding transfer standards for high-resistance measurements. Interchangeable guard networks are used in the improved transfer standards to ensure complete guarding during all phases of the measurement process thus reducing errors caused by leakages to ground. These improved transfer standards have been developed to support National Institute of Standards and Technology (NIST) calibration services over the range 10 MΩ to 1 TΩ and to support extension of the calibration service to 10 TΩ and 100 TΩ
  • Keywords
    bridge circuits; calibration; electric resistance measurement; resistors; transfer standards; 1 Mohm to 100 Gohm; 10 Mohm to 1 Tohm; 10 to 100 Tohm; Hamon transfer standards; NIST calibration service support; bridge circuits; effectiveness of guard networks; external guard networks; guard circuit theory; guarded high-resistance; high-resistance measurements; improved design; interchangeable guard networks; internal guard networks; resistors; Bridge circuits; Circuit theory; Coaxial components; Electrical resistance measurement; Fixtures; Leakage current; Measurement standards; NIST; Resistors; Standards development;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.769593
  • Filename
    769593