Title :
Fabrication of high-value standard resistors
Author :
Dziuba, Ronald F. ; Jarrett, D.G. ; Scott, Lisa L. ; Secula, Andrew J.
Author_Institution :
Electron. & Electr. Eng. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
4/1/1999 12:00:00 AM
Abstract :
The National Institute of Standards and Technology (NIST) has fabricated stable, transportable 10 MΩ and 1 GΩ standard resistors for use in an international comparison of high resistances. This fabrication process is being applied to the construction of standard resistors of values up to 10 TΩ, with initial results indicating significant improvements in stability and fewer adverse effects induced by mechanical shock and vibration
Keywords :
electric resistance measurement; resistors; thin film resistors; transfer standards; 1 Gohm; 10 Mohm; 10 Tohm; fabrication; film-type resistors; high resistances; high-value standard resistors; international comparison; stability improvement; transportable resistors; wire-wound resistors; Conductivity; Electric shock; Fabrication; Measurement standards; NIST; Resistors; Stability; Surface resistance; Vibrations; Wire;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
