DocumentCode
1519471
Title
Fabrication of high-value standard resistors
Author
Dziuba, Ronald F. ; Jarrett, D.G. ; Scott, Lisa L. ; Secula, Andrew J.
Author_Institution
Electron. & Electr. Eng. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume
48
Issue
2
fYear
1999
fDate
4/1/1999 12:00:00 AM
Firstpage
333
Lastpage
337
Abstract
The National Institute of Standards and Technology (NIST) has fabricated stable, transportable 10 MΩ and 1 GΩ standard resistors for use in an international comparison of high resistances. This fabrication process is being applied to the construction of standard resistors of values up to 10 TΩ, with initial results indicating significant improvements in stability and fewer adverse effects induced by mechanical shock and vibration
Keywords
electric resistance measurement; resistors; thin film resistors; transfer standards; 1 Gohm; 10 Mohm; 10 Tohm; fabrication; film-type resistors; high resistances; high-value standard resistors; international comparison; stability improvement; transportable resistors; wire-wound resistors; Conductivity; Electric shock; Fabrication; Measurement standards; NIST; Resistors; Stability; Surface resistance; Vibrations; Wire;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.769595
Filename
769595
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