Title :
An Analysis and Survey of the Development of Mutation Testing
Author :
Jia, Yue ; Harman, Mark
Author_Institution :
Dept. of Comput. Sci., Univ. Coll. London, London, UK
Abstract :
Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has contributed a set of approaches, tools, developments, and empirical results. This paper provides a comprehensive analysis and survey of Mutation Testing. The paper also presents the results of several development trend analyses. These analyses provide evidence that Mutation Testing techniques and tools are reaching a state of maturity and applicability, while the topic of Mutation Testing itself is the subject of increasing interest.
Keywords :
fault diagnosis; program testing; comprehensive analysis; development trend analysis; empirical results; fault-based software testing technique; mutation testing development; mutation testing technique; mutation testing tool; Automata; Books; Computer languages; Educational institutions; Fault detection; Genetic mutations; History; Java; Programming profession; Software testing; Mutation testing; survey.;
Journal_Title :
Software Engineering, IEEE Transactions on
DOI :
10.1109/TSE.2010.62