Title :
Automated ADC characterization using the histogram test stimulated by Gaussian noise
Author :
Martins, Raul Carneiro ; Serra, António Manuel da Cruz
Author_Institution :
Inst. de Telecommun., Lisbon Tech. Univ., Portugal
fDate :
4/1/1999 12:00:00 AM
Abstract :
A broadband variant of the histogram test where Gaussian noise is used as a stimulus signal is presented. A methodology allowing for an automated and extensive characterization of analog-to-digital converters (ADCs) is given. Tolerance and confidence intervals are determined both for the integral nonlinearity (INL) and differential nonlinearity (DNL) vectors, related to the number of samples acquired. Experimental results of the characterization of a VXI waveform digitizer using this methodology are shown
Keywords :
Gaussian noise; analogue-digital conversion; automatic testing; integrated circuit testing; normal distribution; white noise; Gaussian noise stimulation; PDF; VXI waveform digitizer; automated ADC characterization; confidence intervals; differential nonlinearity vectors; histogram test; integral nonlinearity vectors; merit figures; normally distributed noise; pseudo-random sequence; statistical testing; tolerance; transfer function; white noise; Automatic testing; Frequency; Gaussian noise; Histograms; Noise generators; Signal generators; Statistical analysis; Transfer functions; Voltage; White noise;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
