Title :
The IMGC calibration setup for microdisplacement actuators
Author :
Sacconi, Attilio ; Picotto, Gian Bartolo ; Pasin, Walter
Author_Institution :
Inst. di Metrol., CNR, Torino, Italy
fDate :
4/1/1999 12:00:00 AM
Abstract :
For the calibration of piezo-capacitive displacement actuators, we use an interferometric setup with subnanometric resolution. In order to minimize the periodic nonlinearity effect of the laser interferometer, the optical path difference is changed in steps of λ, obtained from a computer-based loop control of the out-of-phase difference between the reference and the measuring signal of the interferometer. Experimental results show an expanded uncertainty of about 0.7 nm +0.1×10-3 L. The calibrated actuator is then used as a transfer standard at the nanometer level, both for testing the nonlinearity of the laser interferometer and for calibrating the linear variable differential transformer (LVDT) probe of the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, roundness instrument (used for measuring silicon spheres for the Avogadro constant)
Keywords :
calibration; capacitive sensors; differential transformers; displacement control; displacement measurement; light interferometry; measurement by laser beam; measurement uncertainty; microactuators; micropositioning; piezoelectric actuators; piezoelectric transducers; transfer standards; Avogadro constant; calibration setup; capacitive sensors; computer-based loop control; displacement control; expanded uncertainty; heterodyne technique; interferometric setup; laser interferometer; linear variable differential transformer probe; measuring signal; microdisplacement actuators; optical path difference; out-of-phase difference; periodic nonlinearity effect; piezo-capacitive displacement actuators; precise positioning; reference signal; roundness instrument; silicon spheres measurement; subnanometric resolution; transfer standard; uncertainty; Calibration; Hydraulic actuators; Instruments; Laser transitions; Optical computing; Optical control; Optical interferometry; Probes; Signal resolution; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on