• DocumentCode
    1520125
  • Title

    Image reconstruction from Ipswich data. III

  • Author

    van den Berg, P.M. ; Kooij, B.J. ; Kleinman, R.E.

  • Author_Institution
    Lab. of Electromagn. Res., Delft Univ. of Technol., Netherlands
  • Volume
    41
  • Issue
    2
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    27
  • Lastpage
    32
  • Abstract
    For pt.II see ibid., vol.39, p.29-32 (1997). We describe results obtained in image reconstruction using the Ipswich data sets IPS009-IPS012. In van den Berg et al. (1995, 1997) and van den Berg and Kleinman (1996), we employed versions of the modified gradient method to reconstruct the shape, location, and index of refraction of known and unknown scatterers, both dielectric and perfectly conducting, from the measured scattered field data contained in IPS001-IPS008. In the present paper, we employ a new inversion method, the contrast source inversion (CSI) method, for the reconstructions. We include here a brief description of the method, given in greater detail in van den Berg and Kleinman. In the case of the new Ipswich experiments, we have 36 angles of incidence, equidistantly distributed around the object. The unknown scatterer is assumed to be located somewhere in a known, bounded, test domain D (taken to be square), and the scattered field is measured on a domain S (taken to be a circle) containing the test domain D in its interior. In the case of the Ipswich experiments, S was taken to be in the far zone of the scattered field, and measurements were made at 18 angles of observation, equidistantly distributed over a semicircle. For each experiment, this semicircle started with the forward-scattering angle
  • Keywords
    electromagnetic wave scattering; image reconstruction; CSI method; Ipswich data; angles of incidence; contrast source inversion method; dielectric scatterer; forward-scattering angle; image reconstruction; index of refraction; inversion method; location; perfectly conducting scatterer; scattered field data; shape; unknown scatterer; Electromagnetic scattering; Equations; Gradient methods; Image reconstruction; Inverse problems; Mathematics; Noise measurement; Permittivity; Shape measurement; Testing;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1045-9243
  • Type

    jour

  • DOI
    10.1109/74.769689
  • Filename
    769689