Title :
A millimeter-wave six-port reflectometer based on the sampled-transmission line architecture
Author :
Ülker, Sadik ; Weikle, Robert M., II
Author_Institution :
Sch. of Eng. & Appl. Sci., Virginia Univ., Charlottesville, VA, USA
Abstract :
This letter presents a proof-of-concept implementation of a millimeter-wave reflectometer for measuring complex reflection coefficients. The reflectometer is based on the six-port architecture and consists of a single section of WR-10 rectangular waveguide and a set of three Schottky power detectors. Design considerations as well as measurements in the 75 to 110 GHz range are described and discussed. Because of its simple architecture, the reflectometer is amenable to scaling for measurements well into the submillimeter-wave region of the spectrum.
Keywords :
high-frequency transmission lines; microwave reflectometry; millimetre wave measurement; network analysers; reflectometers; 75 to 110 GHz; Schottky power detectors; WR-10 rectangular waveguide; complex reflection coefficient measurement; design considerations; millimeter-wave six-port reflectometer; network analyzer; proof-of-concept implementation; sampled-transmission line architecture; scaling; submillimeter-wave region; Detectors; Frequency; Millimeter wave measurements; Millimeter wave technology; Power transmission lines; Submillimeter wave circuits; Submillimeter wave propagation; Transmission line measurements; Voltage; Voltmeters;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/7260.941783
