• DocumentCode
    1520230
  • Title

    Thermal degradation of electrical insulating materials and the thermokinetic background: experimental data

  • Author

    Montanari, G.C. ; Lebok, F.J.

  • Author_Institution
    Istituto de Elettrotecnica Ind., Bologna Univ., Italy
  • Volume
    25
  • Issue
    6
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    1037
  • Lastpage
    1045
  • Abstract
    For pt.I see ibid., vol.25, 1029-1036, 1990. The purpose of this work is to verify the validity of the new degradation model and the transformation equations which have been developed on the basis of thermokinetic considerations. This verification is implemented by comparing the temperature index (TI) values obtained by the thermal life equations, and their converted forms as transformation equations, for a large amount of material data with TI results estimated by tests carried out according to IEC Standard 216. The TI values relate to insulating materials with constant endurance-line slope as well as to materials with both constant and variable endurance-line slope. These families of life lines are named either parallel or nonparallel life lines. The equations developed provide estimates of the TIs that are, in general, close to those obtained by thermal endurance tests conducted according to IEC 216 procedures
  • Keywords
    ageing; insulating materials; insulation testing; life testing; IEC Standard 216; constant endurance-line slope; degradation model; electrical insulating materials; nonparallel life lines; parallel life lines; temperature index; thermal degradation; thermal life equations; thermokinetic background; transformation equations; variable endurance-line slope; Conducting materials; Dielectrics and electrical insulation; Equations; IEC standards; Life estimation; Life testing; Materials testing; Temperature; Thermal conductivity; Thermal degradation;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.64488
  • Filename
    64488