Ammeter induced perturbations of Argand diagrams for Debye-like dielectrics

The role of the ammeter in dielectric measurements performed when this device is put in series with the studied sample, is investigated using Argand diagrams. Emphasis is placed on diagram distortions resulting from the ammeter influence, and, on misleading interpretations to which an experimenter can be led when completely neglecting this influence. This study is extended to cases where the ratio C _xs/C_x∞ of sample static and high-frequency capacitances becomes very large, and where conductivity is enhanced