• DocumentCode
    1520549
  • Title

    Test sequencing algorithms with unreliable tests

  • Author

    Raghavan, Vijaya ; Shakeri, Mojdeh ; Pattipati, Krishna

  • Author_Institution
    Mathworks Inc., Natick, MA, USA
  • Volume
    29
  • Issue
    4
  • fYear
    1999
  • fDate
    7/1/1999 12:00:00 AM
  • Firstpage
    347
  • Lastpage
    357
  • Abstract
    In this paper, we consider imperfect test sequencing problems under a single fault assumption. This is a partially observed Markov decision problem (POMDP), a sequential multistage decision problem wherein a failure source must be identified using the results of imperfect tests at each stage. The optimal solution for this problem can be obtained by applying a continuous-state dynamic programming (DP) recursion. However, the DP recursion is computationally very expensive owing to the continuous nature of the state vector comprising the probabilities of faults. In order to alleviate this computational explosion, we present an efficient implementation of the DP recursion. We also consider various problems with special structure (parallel systems) and derive closed form solutions/index-rules without having to resort to DP. Finally, we present various top-down graph search algorithms for problems with no special structure, including multistep DP, multistep information heuristics, and certainty equivalence algorithms
  • Keywords
    Markov processes; computational complexity; decision theory; dynamic programming; graph theory; probability; recursion method; reliability; search problems; testing; DP recursion; POMDP; certainty equivalence algorithms; closed form solutions; computational expense; computational explosion; continuous-state dynamic programming recursion; fault probabilities; imperfect test sequencing problems; index-rules; multistep DP; multistep information heuristics; parallel systems; partially observed Markov decision problem; sequential multistage decision problem; single fault assumption; test sequencing algorithms; top-down graph search algorithms; unreliable tests; Automatic testing; Closed-form solution; Costs; Dynamic programming; Electromagnetic interference; Entropy; Explosions; Fault diagnosis; Sequential analysis; System testing;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4427
  • Type

    jour

  • DOI
    10.1109/3468.769753
  • Filename
    769753