Title :
Test sequencing algorithms with unreliable tests
Author :
Raghavan, Vijaya ; Shakeri, Mojdeh ; Pattipati, Krishna
Author_Institution :
Mathworks Inc., Natick, MA, USA
fDate :
7/1/1999 12:00:00 AM
Abstract :
In this paper, we consider imperfect test sequencing problems under a single fault assumption. This is a partially observed Markov decision problem (POMDP), a sequential multistage decision problem wherein a failure source must be identified using the results of imperfect tests at each stage. The optimal solution for this problem can be obtained by applying a continuous-state dynamic programming (DP) recursion. However, the DP recursion is computationally very expensive owing to the continuous nature of the state vector comprising the probabilities of faults. In order to alleviate this computational explosion, we present an efficient implementation of the DP recursion. We also consider various problems with special structure (parallel systems) and derive closed form solutions/index-rules without having to resort to DP. Finally, we present various top-down graph search algorithms for problems with no special structure, including multistep DP, multistep information heuristics, and certainty equivalence algorithms
Keywords :
Markov processes; computational complexity; decision theory; dynamic programming; graph theory; probability; recursion method; reliability; search problems; testing; DP recursion; POMDP; certainty equivalence algorithms; closed form solutions; computational expense; computational explosion; continuous-state dynamic programming recursion; fault probabilities; imperfect test sequencing problems; index-rules; multistep DP; multistep information heuristics; parallel systems; partially observed Markov decision problem; sequential multistage decision problem; single fault assumption; test sequencing algorithms; top-down graph search algorithms; unreliable tests; Automatic testing; Closed-form solution; Costs; Dynamic programming; Electromagnetic interference; Entropy; Explosions; Fault diagnosis; Sequential analysis; System testing;
Journal_Title :
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
DOI :
10.1109/3468.769753