Title :
Monolithic Capacitive DC-DC Converter With Single Boundary–Multiphase Control and Voltage Domain Stacking in 90 nm CMOS
Author :
Van Breussegem, Tom M. ; Steyaert, Michiel S J
Author_Institution :
MICAS-ESAT, K.U. Leuven Belgium, Leuven, Belgium
fDate :
7/1/2011 12:00:00 AM
Abstract :
Monolithic integration in CMOS has boosted the development of low cost, compact and portable consumer applications. But until now the monolithic integration of DC-DC converters is still omitted in commercial applications. Primarily due to the need for high-efficiency converters and appropriate techniques to control high-frequency capacitive DC-DC converters. This paper presents a fully integrated capacitive step-down DC-DC converter in 90 nm CMOS with an output power capability of 150 mW, a peak efficiency of 77% and a full load efficiency of 74%. The DC-DC converter is controlled by a Single Boundary-Multiphase Control (SB-MC). This control method provides a low power solution for controlling multiphase capacitive DC-DC converters without compromising the control loop bandwidth. This paper describes the design, implementation and measurements of the DC-DC converter.
Keywords :
CMOS integrated circuits; DC-DC power convertors; CMOS; capacitive step-down DC-DC converter; high-efficiency converters; monolithic capacitive DC-DC converter; single boundary-multiphase control; size 90 nm; voltage domain stacking; CMOS integrated circuits; Capacitors; Impedance; Logic gates; Mathematical model; Switching frequency; Topology; CMOS; Capacitive DC-DC converter; monolithic; single boundary–multiphase control;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2011.2144350