Title :
Frequency-Shift Filtering for OFDM Systems and Its Performance Analysis
Author :
Tian, Jinfeng ; Guo, Haiyou ; Hu, Honglin ; Chen, Hsiao Hwa
Author_Institution :
Shanghai Res. Center for Wireless Commun. (WiCO), Shanghai Inst. of Microsyst. & Inf. Technol. (SIMIT), Shanghai, China
Abstract :
Orthogonal frequency division multiplexing (OFDM) technique has been widely used in high data rate wireless applications, but it suffers performance degradation at low signal-to-noise (SNR) regions due to the impairments caused by noise-induced channel estimation errors. In this article, we propose to use frequency-shift (FRESH) filtering technique to exploit temporal and spectral correlation of the OFDM signals for noise reduction purpose. A closed form time-varying minimum mean squared error (MMSE) expression has been derived to analyze the performance of FRESH filtering under additive white Gaussian noise (AWGN) and Rayleigh fading channels. The MMSE analysis carried out here can be a reference for the design of practical OFDM systems. In addition, theoretical SNR is analyzed in this article to show the performance gain achieved by FRESH filtering. The numerical results verify that the maximum SNR improvements offered by FRESH filtering are over 0.6 dB and 1.6 dB under AWGN and Rayleigh fading channels, respectively.
Keywords :
AWGN channels; OFDM modulation; Rayleigh channels; channel estimation; filtering theory; frequency shift keying; interference suppression; least mean squares methods; spectral analysis; time-varying channels; AWGN channels; FRESH filtering; MMSE; OFDM signal; Rayleigh fading channels; additive white Gaussian noise; channel estimation; frequency shift filtering; minimum mean squared error; noise reduction; orthogonal frequency division multiplexing; performance analysis; spectral correlation; temporal correlation; time-varying channel; AWGN; Fading; Frequency shift keying; OFDM; Signal to noise ratio; Wireless communication; Frequency-shift filtering; MMSE; OFDM system; wireless communication;
Journal_Title :
Systems Journal, IEEE
DOI :
10.1109/JSYST.2011.2148770