• DocumentCode
    1520782
  • Title

    Lithium micro-battery development at the Jet Propulsion Laboratory

  • Author

    West, W.C. ; Whitacre, J.F. ; Brandon, E.J. ; Ratnakumar, B.V.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    16
  • Issue
    8
  • fYear
    2001
  • fDate
    8/1/2001 12:00:00 AM
  • Firstpage
    31
  • Lastpage
    33
  • Abstract
    Recent successes in the effort to miniaturize spacecraft components using MEMS technology, integrated passive components, and low power electronics have driven the need for very low power, low profile, low mass micro-power sources for micro/nanospacecraft applications. Recent work at JPL has focused upon developing thin film/micro-batteries compatible with temperature sensitive substrates. A process to prepare crystalline LiCoO2 films with RF sputtering and moderate (<700°C) annealing temperature has been developed. Thin film batteries with cathode films prepared with this process have specific capacities approaching the practical limit for LiCoO2, with acceptable rate capabilities and discharge voltage profiles. Solid-state micro-scale batteries have also been fabricated with feature sizes on the order of 50 microns
  • Keywords
    annealing; lithium compounds; low-power electronics; micromechanical devices; secondary cells; space vehicle power plants; sputter deposition; LiCoO2; MEMS technology; RF sputtering; cathode films; discharge voltage profiles; etching; lithium microbattery development; low mass micropower sources; low power electronics; microspacecraft; miniature spacecraft components; moderate annealing temperature; nanospacecraft; solid-state microscale batteries; temperature sensitive substrates; thin film batteries; Batteries; Laboratories; Lithium; Low power electronics; Micromechanical devices; Propulsion; Space technology; Space vehicles; Sputtering; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/62.942217
  • Filename
    942217