Title :
Principal Line-Based Alignment Refinement for Palmprint Recognition
Author :
Li, Wei ; Zhang, Bob ; Zhang, Lei ; Yan, Jingqi
Author_Institution :
Shenzhen Inst. of Adv. Technol., Shenzhen, China
Abstract :
Image alignment is an important step in various biometric authentication applications such as palmprint recognition. Most of the existing palmprint alignment methods make use of some key points between fingers or in palm boundary to establish the local coordinate system for region of interest (ROI) extraction. The ROI is consequently used for feature extraction and matching. Such alignment methods usually yield a coarse alignment of the palmprint images, while many missed and false matches are actually caused by inaccurate image alignments. To improve the palmprint verification accuracy, in this paper, we present an efficient palmprint alignment refinement method. After extracting the principal lines from the palmprint image, we apply the iterative closest point method to them to estimate the translation and rotation parameters between two images. The estimated parameters are then used to refine the alignment of palmprint feature maps for a more accurate palmprint matching. The experimental results show that the proposed method greatly improves the palmprint recognition accuracy and it works in real time.
Keywords :
feature extraction; image matching; iterative methods; palmprint recognition; parameter estimation; ROI extraction; biometric authentication; coarse alignment; feature extraction; feature matching; image alignment; iterative closest point method; local coordinate system; palm boundary; palmprint alignment method; palmprint recognition; palmprint verification accuracy; parameter estimation; principal line-based alignment refinement; region of interest extraction; Accuracy; Feature extraction; Image recognition; Iterative closest point algorithm; Lighting; Morphological operations; Robustness; Biometrics; image alignment; line extraction; palmprint recognition;
Journal_Title :
Systems, Man, and Cybernetics, Part C: Applications and Reviews, IEEE Transactions on
DOI :
10.1109/TSMCC.2012.2195653