A low-IF RX two-point ΣΔ-modulation TX CMOS single-chip Bluetooth solution

Author

Dürdodt, Christian ; Friedrich, Martin ; Grewing, Christian ; Hammes, Markus ; Hanke, André ; Heinen, Stefan ; Oehm, Jürgen ; Pham-Stäbner, Duyen ; Seippel, Dietolf ; Theil, Detlev ; Van Waasen, Stefan ; Wagner, Elmar

Author_Institution

Microelectron. Dev. Centre, Infineon Technol. AG, Dusseldorf, Germany

Volume

49

Issue

9

fYear

2001

fDate

9/1/2001 12:00:00 AM

Firstpage

1531

Lastpage

1537

Abstract

A new low-cost concept for a system-on-chip Bluetooth solution is proposed in this paper. The single chip includes all necessary baseband and RF parts to achieve full Bluetooth functionality and is implemented in a standard 0.25-μm CMOS technology. The two-point modulation ΣΔ fractional N phase-locked loop achieves a phase noise of -124 dBc/Hz at 3-MHz offset. The sensitivity of the embedded low-IF receiver is measured to be -82 dBm at a bit error rate of 0.1%. The power supply voltages for the digital and analog parts are internally regulated to 2.65 V. The maximum current consumption of the analog part is 60 mA

Keywords

CMOS integrated circuits; phase locked loops; phase noise; radio receivers; radio transmitters; sigma-delta modulation; 0.25 micron; 2.65 V; 60 mA; Bluetooth technology; CMOS single chip; RFIC; bit error rate; embedded low-IF receiver; fractional N phase-locked loop; phase noise; system-on-chip; two-point ΣΔ-modulation transmitter; wireless communication; Baseband; Bit error rate; Bluetooth; CMOS technology; Phase locked loops; Phase modulation; Phase noise; Radio frequency; Semiconductor device measurement; System-on-a-chip;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.942563

Filename

942563