DocumentCode :
1521226
Title :
On the modeling of highly nonlinear circuits using total-variation-decreasing finite-difference schemes
Author :
Thiel, Werner ; Menzel, Wolfgang
Author_Institution :
Dept. of Microwave Technol., Ulm Univ., Germany
Volume :
49
Issue :
9
fYear :
2001
fDate :
9/1/2001 12:00:00 AM
Firstpage :
1620
Lastpage :
1625
Abstract :
This paper presents the modeling of highly nonlinear circuits using a total-variation-decreasing (TVD) difference scheme developed for the simulation of problems involving shock phenomena. In contrast to the commonly used leapfrog scheme, a second-order accurate TVD method based on the Lax-Wendroff scheme is applied to one-dimensional nonlinear transient electromagnetic-wave problems. Furthermore, for the analysis of transmission-line-based networks, an adapted inclusion of nonlinear lumped elements in such a TVD scheme is proposed. As an example, both the scattered signals of a linear transmission line loaded with a nonlinear lumped element is investigated and the formation of a shock-wave of a low-loss nonlinear transmission line with distributed diodes is studied. In the simulation results, the modeling of rapidly rising edges occurring in the time signal are demonstrated
Keywords :
equivalent circuits; finite difference methods; microwave circuits; nonlinear network analysis; transient analysis; transmission line theory; 1D nonlinear transient EM wave problems; Lax-Wendroff scheme; distributed diodes; finite-difference scheme; highly nonlinear circuits; low-loss nonlinear transmission line; modeling; nonlinear lumped elements; scattered signals; second-order accurate TVD method; shock wave formation; simulation; total-variation-decreasing difference scheme; transmission-line-based networks; Circuit simulation; Diodes; Distributed parameter circuits; Electric shock; Electromagnetic scattering; Finite difference methods; Fluid dynamics; Microwave theory and techniques; Nonlinear circuits; Transmission lines;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.942575
Filename :
942575
Link To Document :
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