• DocumentCode
    1521345
  • Title

    Floating Gate Memory With Biomineralized Nanodots Embedded in \\hbox {HfO}_{2}

  • Author

    Ohara, Kosuke ; Tojo, Yosuke ; Yamashita, Ichiro ; Yaegashi, Toshitake ; Moniwa, Masahiro ; Yoshimaru, Masaki ; Uraoka, Yukiharu

  • Author_Institution
    Grad. Sch. of Mater. Sci., Nara Inst. of Sci. & Technol., Ikoma, Japan
  • Volume
    10
  • Issue
    3
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    576
  • Lastpage
    581
  • Abstract
    Memory properties of a nanodot-type floating gate memory with Co-bio-nanodots (Co-BNDs) embedded in HfO2 were investigated. High density and uniform Co-BNDs were adsorbed on a HfO2 tunnel oxide using ferritin. The fabricated MOS capacitor exhibited a capacitance-voltage curve with large hysteresis. The memory window size was 30 times larger than that of the MOS capacitor with an SiO2 gate oxide. Not only a large memory window but also excellent charge retention and reliability characteristics were obtained for an MOS field-effect transistor. The high-performance nanodot-type floating gate memory was first fabricated at low temperature by utilizing supramolecular protein.
  • Keywords
    MOS capacitors; MOSFET; biomineralisation; biomolecular electronics; capacitance; cobalt; hafnium compounds; nanoelectronics; nanostructured materials; proteins; Co-HfO2; MOS capacitor; MOS field-effect transistor; biomineralized nanodots; bionanodot embedding; capacitance-voltage curve; charge reliability; charge retention; ferritin; high-performance nanodot-type floating gate memory; memory window size; supramolecular protein; tunnel oxide; FETs; Hafnium oxide; High K dielectric materials; High-K gate dielectrics; Large scale integration; MOS capacitors; Nanostructures; Nonvolatile memory; Proteins; Temperature; Bio-nano process; MOS devices; ferritin; floating gate memory; high-$k$;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2010.2053852
  • Filename
    5491186