• DocumentCode
    1521409
  • Title

    Effect of local stir and spatial averaging on measurement and testing in mode-tuned and mode-stirred reverberation chambers

  • Author

    Arnaut, Luk R.

  • Author_Institution
    Center for Electromagn. & Time Metrol., Nat. Phys. Lab., Teddington, UK
  • Volume
    43
  • Issue
    3
  • fYear
    2001
  • fDate
    8/1/2001 12:00:00 AM
  • Firstpage
    305
  • Lastpage
    325
  • Abstract
    The effect of local averaging in mode-tuned and mode-stirred reverberation chambers is investigated, under the assumption of a wide-sense stationary statistical cavity field. The analysis is based on the characterization of the tuning or stirring process in the spectral spatial domain and in the spectral stir domain. The variance function, scale of fluctuation, optimum sampling rate, and normalized spectral bandwidths are computed for each case, based on the modeled power spectral-density function. This second-order analysis enables the effect of local averaging on the point-interval correlation, mean and standard deviation of the maximum test level, upward threshold crossing frequency, time to first passage and mean excursion length to be quantified. The theoretical results for quantifying EUT reliability are illustrated and compared with measured data. The results provide guidelines for the maximum tolerable sensor aperture and stirrer step sizes for mode tuning, and sampling rate and sampling width for mode stirring in chamber calibration and EMC emissions and susceptibility testing
  • Keywords
    conformance testing; electromagnetic compatibility; reliability; reverberation chambers; signal sampling; spectral analysis; spectral-domain analysis; EMC emissions; EUT reliability; calibration; fluctuation scale; local averaging; local stir; maximum test level; maximum tolerable sensor aperture; mean deviation; mean excursion length; mode-stirred reverberation chambers; mode-tuned reverberation chambers; modeled power spectral-density function; normalized spectral bandwidths; optimum sampling rate; point-interval correlation; sampling width; second-order analysis; spatial averaging; spectral spatial domain; spectral stir domain; standard deviation; stirrer step sizes; susceptibility testing; time to first passage; upward threshold crossing frequency; variance function; wide-sense stationary statistical cavity field; Apertures; Bandwidth; Fluctuations; Frequency; Guidelines; Reliability theory; Reverberation chamber; Sampling methods; Testing; Tuning;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.942603
  • Filename
    942603