• DocumentCode
    1521525
  • Title

    Novel Low Overhead Post-Silicon Self-Correction Technique for Parallel Prefix Adders Using Selective Redundancy and Adaptive Clocking

  • Author

    Ghosh, Swaroop ; Roy, Kaushik

  • Author_Institution
    Dept. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    19
  • Issue
    8
  • fYear
    2011
  • Firstpage
    1504
  • Lastpage
    1507
  • Abstract
    In this paper, we present a post-silicon self-correction technique to leverage the redundancy present in parallel prefix adders (PPA). Our technique is based on the fact that a set of carries in PPAs can be made mutually exclusive. Therefore, defects in a set of bits can only corrupt the corresponding set of Sum outputs whereas the remaining Sums are computed correctly. To efficiently utilize the above property of PPAs in presence of defects, we perform addition in multiple clock cycles. In cycle-1, one of the correct set of bits are computed and stored at the output registers. In the subsequent cycles, the operands are shifted by one bit at a time and the remaining sets of bits are recovered. This allows us to compute the correct output at the cost of throughput degradation and minor area and delay overhead while maintaining high frequency and yield. Finally, the proposed technique is used in a superscalar processor, whereby the self-correcting adder is assigned lower priority than fault-free adders to reduce the overall throughput degradation.
  • Keywords
    adders; clocks; delays; microprocessor chips; parallel architectures; redundancy; adaptive clocking; fault free adder; low overhead post silicon selfcorrection technique; multiple clock cycle; parallel prefix adder; selfcorrecting adder; sum output; superscalar processor; throughput degradation; Adders; Circuit faults; Clocks; Costs; Degradation; Delay; Frequency; Redundancy; Registers; Throughput; Adaptive clocking; parallel prefix adders; self-correction; spatial and temporal redundancy;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2010.2051169
  • Filename
    5491281