• DocumentCode
    1521617
  • Title

    Scattering from non-Gaussian randomly rough surfaces-cylindrical case

  • Author

    Wu, S.C. ; Chen, M.F. ; Fung, Adrian K.

  • Author_Institution
    Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
  • Volume
    26
  • Issue
    6
  • fYear
    1988
  • fDate
    11/1/1988 12:00:00 AM
  • Firstpage
    790
  • Lastpage
    798
  • Abstract
    A numerical method is developed to simulate electromagnetic wave scattering from computer-generated two-dimensional randomly rough surfaces. The rough surface generated for scattering simulation is specified only up to the second moment statistics, i.e. the height distribution and the autocorrelation function. The coherent and noncoherent scattering from four different types of random surfaces is examined. The four different types of surfaces are: Gaussian distributed heights and Gaussian correlation, Gaussian distributed height and non-Gaussian correlation, modified exponential distributed height and non-Gaussian correlation, modified exponential distributed height and Gaussian correlation, modified exponential distributed height and non-Gaussian correlation surfaces. It is shown by simulation that the dominating factor in coherent scattering is the surface height density and the autocorrelation can cause a higher order effect
  • Keywords
    electromagnetic wave scattering; geophysical techniques; radar cross-sections; radar theory; remote sensing; EM wave scattering; autocorrelation function; coherent; cylindrical case; electromagnetic wave scattering; height distribution; land surface remote sensing; nonGaussian; noncoherent; numerical model; radar; radiowave; rough surface; two-dimensional randomly rough surfaces; Backscatter; Computational modeling; Computer aided software engineering; Electromagnetic scattering; Kirchhoff´s Law; Optical scattering; Optical surface waves; Rough surfaces; Surface roughness; Surface waves;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/36.7710
  • Filename
    7710