Title :
High-speed modulation of 850-nm intracavity contacted shallow implant-apertured vertical-cavity surface-emitting lasers
Author :
Dang, G. ; Hobson, W.S. ; Chirovsky, L.M.F. ; Lopata, J. ; Tayahi, M. ; Chu, S.N.G. ; Ren, F. ; Pearton, S.J.
Author_Institution :
Dept. of Chem. Eng., Florida Univ., Gainesville, FL, USA
Abstract :
GaAs-AlGaAs quantum-well (850 nn) vertical-cavity surface-emitting lasers, with lateral current injection and shallow implanted apertures, show small signal modulation bandwidths of at least 11 GHz and large signal data rates of at least 10 Gb/s. The devices achieved a maximum output power of 2.1 mW, with a threshold current and voltage of 1 mA and 1.71 V, respectively. The shallow implantation step provides photolithographically precise aperture formation (using O/sup +/ ions), for efficient lateral current injection into the quantum-well active region of the laser, from intracavity contacts. The device aperture was 7 μm in diameter, and the opening in the annular top contact was 13 μm in diameter. The optical spectrum showed several transverse modes.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high-speed optical techniques; ion implantation; laser modes; optical modulation; quantum well lasers; semiconductor quantum wells; surface emitting lasers; 1 mA; 1.71 V; 10 Gbit/s; 11 GHz; 13 mum; 2.1 mW; 7 mum; 850 nm; GaAs-AlGaAs; GaAs-AlGaAs quantum-well VCSEL; O/sup +/ ions; annular top contact opening diameter; device aperture diameter; high-speed modulation; intracavity contacted shallow implant-apertured vertical-cavity surface-emitting lasers; lateral current injection; maximum output power; optical spectrum; photolithographically precise aperture formation; quantum-well active region; shallow implantation step; shallow implanted apertures; signal data rates; small signal modulation bandwidths; threshold current; threshold voltage; transverse modes; Apertures; Bandwidth; High speed optical techniques; Laser modes; Power generation; Quantum well lasers; Surface emitting lasers; Threshold current; Threshold voltage; Vertical cavity surface emitting lasers;
Journal_Title :
Photonics Technology Letters, IEEE