DocumentCode
1521799
Title
Transfer of GaSb thin film to insulating substrate via separation by hydrogen implantation
Author
Hobart, K.D. ; Kub, F.J.
Author_Institution
Naval Res. Lab., Washington, DC, USA
Volume
35
Issue
8
fYear
1999
fDate
4/15/1999 12:00:00 AM
Firstpage
675
Lastpage
676
Abstract
Thin films of GaSb were transferred to insulating substrates by a combination of wafer bonding and separation by hydrogen ion implantation. Hydrogen ion implantation and exfoliation were successfully exploited to transfer a 240 nm thick GaSb film to a glass substrate at temperatures ⩽150°C. A novel room temperature wafer bonding technique utilising an ultraviolet/ozone process was also demonstrated. The films have been characterised by atomic force and scanning electron microscopies
Keywords
III-V semiconductors; atomic force microscopy; gallium compounds; ion implantation; scanning electron microscopy; semiconductor thin films; wafer bonding; 150 C; GaSb; GaSb thin film transfer; atomic force microscopy; exfoliation; insulating glass substrate; scanning electron microscopy; separation by hydrogen implantation; ultraviolet/ozone process; wafer bonding;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19990477
Filename
771028
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