• DocumentCode
    1521799
  • Title

    Transfer of GaSb thin film to insulating substrate via separation by hydrogen implantation

  • Author

    Hobart, K.D. ; Kub, F.J.

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • Volume
    35
  • Issue
    8
  • fYear
    1999
  • fDate
    4/15/1999 12:00:00 AM
  • Firstpage
    675
  • Lastpage
    676
  • Abstract
    Thin films of GaSb were transferred to insulating substrates by a combination of wafer bonding and separation by hydrogen ion implantation. Hydrogen ion implantation and exfoliation were successfully exploited to transfer a 240 nm thick GaSb film to a glass substrate at temperatures ⩽150°C. A novel room temperature wafer bonding technique utilising an ultraviolet/ozone process was also demonstrated. The films have been characterised by atomic force and scanning electron microscopies
  • Keywords
    III-V semiconductors; atomic force microscopy; gallium compounds; ion implantation; scanning electron microscopy; semiconductor thin films; wafer bonding; 150 C; GaSb; GaSb thin film transfer; atomic force microscopy; exfoliation; insulating glass substrate; scanning electron microscopy; separation by hydrogen implantation; ultraviolet/ozone process; wafer bonding;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19990477
  • Filename
    771028