Title :
Transfer of GaSb thin film to insulating substrate via separation by hydrogen implantation
Author :
Hobart, K.D. ; Kub, F.J.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
fDate :
4/15/1999 12:00:00 AM
Abstract :
Thin films of GaSb were transferred to insulating substrates by a combination of wafer bonding and separation by hydrogen ion implantation. Hydrogen ion implantation and exfoliation were successfully exploited to transfer a 240 nm thick GaSb film to a glass substrate at temperatures ⩽150°C. A novel room temperature wafer bonding technique utilising an ultraviolet/ozone process was also demonstrated. The films have been characterised by atomic force and scanning electron microscopies
Keywords :
III-V semiconductors; atomic force microscopy; gallium compounds; ion implantation; scanning electron microscopy; semiconductor thin films; wafer bonding; 150 C; GaSb; GaSb thin film transfer; atomic force microscopy; exfoliation; insulating glass substrate; scanning electron microscopy; separation by hydrogen implantation; ultraviolet/ozone process; wafer bonding;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19990477