Title :
Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements
Author :
Young, P.R. ; McPherson, D.S. ; Chrisostomidis, C. ; Elgaid, K. ; Thayne, I.G. ; Lucyszyn, S. ; Robertson, I.D.
Author_Institution :
Electron. Eng. Labs., Kent Univ., Canterbury, UK
fDate :
6/1/2001 12:00:00 AM
Abstract :
An accurate model for lossy non-uniform transmission lines is presented. The technique provides a coplanar waveguide (CPW) taper model, which has been used to accurately de-embed measurements of passive CPW components in line geometries differing from the nominal 50Ω geometry of the calibration. The model accounts for both dielectric and conductor losses, and is shown to be in excellent agreement with measured results from 45 MHz to 120 GHz
Keywords :
MMIC; S-parameters; coplanar waveguides; integrated circuit measurement; transmission line theory; 45 MHz to 120 GHz; S-parameters; accurate model; conductor losses; coplanar waveguide taper model; dielectric losses; lossy nonuniform transmission lines; nonuniform transmission line model; on-wafer measurements de-embedding; passive CPW components;
Journal_Title :
Microwaves, Antennas and Propagation, IEE Proceedings
DOI :
10.1049/ip-map:20010402
