DocumentCode :
1522364
Title :
Three-dimensional photolithography simulation
Author :
Kirchauer, Heinrich ; Selberherr, Siegfried
Author_Institution :
Institute for Microelectronics, TU Vienna, Gußhausstraße 27-29, A-1040 Vienna, Austria
fYear :
1996
Firstpage :
1
Lastpage :
37
Abstract :
An overall three-dimensional photolithography simulator is presented, which has been developed for workstation based application. The simulator consists of three modules according to the fundamental processes of photolithography, namely imaging, exposure/bleaching and development. General illumination forms are taken into account. The nonlinear bleaching reaction of the photoresist is considered and electromagnetic light-scattering due to a nonplanar topography is treated by solving repeatedly the maxwell equations within an inhomogeneous medium. A novel extension of the two-dimensional differential method into the third dimension is presented and a numerically efficient implementation for exposure simulation under partial coherent illumination is described. the development process is simulated with a cellular based surface advancement algorithm.
Keywords :
Bleaching; Imaging; Lithography; Mathematical model; Numerical models; Resists; Solid modeling;
fLanguage :
English
Journal_Title :
Technology Computer Aided Design TCAD, Journal of
Publisher :
ieee
ISSN :
1097-2102
Type :
jour
DOI :
10.1109/TCAD.1996.6449163
Filename :
6449163
Link To Document :
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