DocumentCode :
1522734
Title :
A short method of estimating lifetime of polypropylene film using step-stress tests
Author :
Laghari, J.R. ; Cygan, P. ; Khechen, W.
Author_Institution :
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
Volume :
25
Issue :
6
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
1180
Lastpage :
1182
Abstract :
Polypropylene films were tested for lifetimes under high electric fields, using both constant and step-stress methods. Various time intervals for the step-stress test and voltages for the constant stress test were selected. The inverse power law was used in the analysis of the experimental data, with the value of the power exponent determined from the step-stress test. This exponent was found similar to that obtained from the constant stress test. The lifetimes of polypropylene were then estimated from the step-stress test and were found to show good agreement with the experimental results of the constant stress test. The Weibull distribution was employed in the analysis of the experimental data
Keywords :
ageing; dielectric materials; life testing; materials testing; polymer films; Weibull distribution; constant stress test; high electric fields; inverse power law; lifetime; polypropylene film; step-stress tests; Aging; Breakdown voltage; Equations; Inverse problems; Life estimation; Life testing; Lifetime estimation; Materials testing; Stress; Weibull distribution;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/14.64506
Filename :
64506
Link To Document :
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