Title :
A short method of estimating lifetime of polypropylene film using step-stress tests
Author :
Laghari, J.R. ; Cygan, P. ; Khechen, W.
Author_Institution :
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
fDate :
12/1/1990 12:00:00 AM
Abstract :
Polypropylene films were tested for lifetimes under high electric fields, using both constant and step-stress methods. Various time intervals for the step-stress test and voltages for the constant stress test were selected. The inverse power law was used in the analysis of the experimental data, with the value of the power exponent determined from the step-stress test. This exponent was found similar to that obtained from the constant stress test. The lifetimes of polypropylene were then estimated from the step-stress test and were found to show good agreement with the experimental results of the constant stress test. The Weibull distribution was employed in the analysis of the experimental data
Keywords :
ageing; dielectric materials; life testing; materials testing; polymer films; Weibull distribution; constant stress test; high electric fields; inverse power law; lifetime; polypropylene film; step-stress tests; Aging; Breakdown voltage; Equations; Inverse problems; Life estimation; Life testing; Lifetime estimation; Materials testing; Stress; Weibull distribution;
Journal_Title :
Electrical Insulation, IEEE Transactions on