• DocumentCode
    1522862
  • Title

    The use of linear models in A/D converter testing

  • Author

    Capofreddi, Peter D. ; Wooley, Bruce A.

  • Author_Institution
    Integrated Circuits Lab., Stanford Univ., CA, USA
  • Volume
    44
  • Issue
    12
  • fYear
    1997
  • fDate
    12/1/1997 12:00:00 AM
  • Firstpage
    1105
  • Lastpage
    1113
  • Abstract
    This paper demonstrates how a linear modeling technique can be applied to three common methods for testing analog-to-digital converters (ADC´s)-the servo-loop method, the tally-and-weight method, and the code density method-to improve their efficiency and accuracy. In order to compare the accuracy of the test procedures that incorporate the linear modeling technique with the corresponding procedures that do not, confidence intervals are derived for the integral and differential nonlinearity (INL and DNL) estimates obtained in both cases. Since the linear model may itself introduce some error in the estimates, the accuracy of the model must be determined in order to make the comparisons meaningful. This is accomplished by using a nested experimental design to determine how much of the variance in the transition levels is accounted for by the model
  • Keywords
    analogue-digital conversion; integrated circuit modelling; integrated circuit testing; A/D converter testing; code density method; differential nonlinearity; integral nonlinearity; linear model; servo-loop method; tally-and-weight method; transition levels; Analog-digital conversion; Circuit testing; Design for experiments; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit testing; Laboratories; Signal resolution; Statistical analysis; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.645145
  • Filename
    645145