Title :
The use of linear models in A/D converter testing
Author :
Capofreddi, Peter D. ; Wooley, Bruce A.
Author_Institution :
Integrated Circuits Lab., Stanford Univ., CA, USA
fDate :
12/1/1997 12:00:00 AM
Abstract :
This paper demonstrates how a linear modeling technique can be applied to three common methods for testing analog-to-digital converters (ADC´s)-the servo-loop method, the tally-and-weight method, and the code density method-to improve their efficiency and accuracy. In order to compare the accuracy of the test procedures that incorporate the linear modeling technique with the corresponding procedures that do not, confidence intervals are derived for the integral and differential nonlinearity (INL and DNL) estimates obtained in both cases. Since the linear model may itself introduce some error in the estimates, the accuracy of the model must be determined in order to make the comparisons meaningful. This is accomplished by using a nested experimental design to determine how much of the variance in the transition levels is accounted for by the model
Keywords :
analogue-digital conversion; integrated circuit modelling; integrated circuit testing; A/D converter testing; code density method; differential nonlinearity; integral nonlinearity; linear model; servo-loop method; tally-and-weight method; transition levels; Analog-digital conversion; Circuit testing; Design for experiments; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit testing; Laboratories; Signal resolution; Statistical analysis; Time measurement;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on