DocumentCode :
1522987
Title :
FDTD analysis of submillimeter-wave CPW with finite-width ground metallization
Author :
Huynh, Ngoc-Hoa ; Heinrich, Wolfgang
Author_Institution :
Ferdinand-Braun-Inst. fur Hochstfrequenztechnik, Berlin, Germany
Volume :
7
Issue :
12
fYear :
1997
fDate :
12/1/1997 12:00:00 AM
Firstpage :
414
Lastpage :
416
Abstract :
The dispersion and attenuation characteristics of conductor-backed coplanar transmission lines with finite-width ground metallizations are studied in the frequency range up to 1 THz. The finite-difference time-domain (FDTD) method is used for analysis. Open boundaries are described by means of Berenger´s perfectly matched layer. The results are compared to electrooptic measurements. They show that introducing ground metallizations of finite width causes distinct changes in attenuation and dispersion characteristics
Keywords :
coplanar waveguides; finite difference time-domain analysis; metallisation; waveguide theory; 1 THz; Berenger perfectly matched layer; FDTD analysis; attenuation; conductor-backed coplanar transmission line; dispersion; electrooptic measurement; finite-width ground metallization; submillimeter-wave CPW; Attenuation; Coplanar transmission lines; Coplanar waveguides; Finite difference methods; Frequency; Metallization; Perfectly matched layers; Submillimeter wave propagation; Time domain analysis; Transmission line measurements;
fLanguage :
English
Journal_Title :
Microwave and Guided Wave Letters, IEEE
Publisher :
ieee
ISSN :
1051-8207
Type :
jour
DOI :
10.1109/75.645193
Filename :
645193
Link To Document :
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