DocumentCode :
1522996
Title :
Temperature distribution control in scanned thermal processing of thin circular parts
Author :
Doumanidis, Charalabos C. ; Fourligkas, Nikolaos
Author_Institution :
Dept. of Mech. Eng., Tufts Univ., Medford, MA, USA
Volume :
9
Issue :
5
fYear :
2001
fDate :
9/1/2001 12:00:00 AM
Firstpage :
708
Lastpage :
717
Abstract :
Scan thermal processing is enabled by guidance of the heat source trajectory during fabrication. For thin, cylindrically symmetric parts, this is performed by their rapid revolution under a radially or axially translated torch, with its power modulated so as to implement a specified thermal distribution as it sweeps the product surface, and thus to generate desirable material features. A new analytical description of the thermal field in thin disk-shaped parts, based on superposition of Green´s functions, was developed for off-line analysis. A multivariable linearized model with least-squares identification of its varying parameters was also derived for real-time emissivity compensation and prediction of delayed temperature data. This model is embedded to a thermal distribution control scheme, driving the scanned torch motion and power by a new real-time simulated annealing optimization strategy, using temperature feedback from randomly sampled surface locations by an infrared pyrometer. The thermal regulator is validated computationally and experimentally
Keywords :
Green´s function methods; distributed parameter systems; feedback; identification; manufacturing processes; radiometry; simulated annealing; temperature control; temperature distribution; Green function; cylindrically symmetric parts; distributed parameter system; emissivity compensation; fabrication; feedback; identification; infrared radiometry; least-squares; multivariable linearized model; scanned thermal processing; simulated annealing; temperature distribution control; Computational modeling; Delay; Fabrication; Green´s function methods; Motion control; Power generation; Predictive models; Rapid thermal processing; Temperature control; Temperature distribution;
fLanguage :
English
Journal_Title :
Control Systems Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-6536
Type :
jour
DOI :
10.1109/87.944466
Filename :
944466
Link To Document :
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