• DocumentCode
    1523096
  • Title

    Life test studies on MM-cathodes

  • Author

    Feltham, S.J. ; Kornfeld, G. ; Lotthammer, R. ; Stevenson, John L.

  • Author_Institution
    ESA/ESTEC, Noordwijk, Netherlands
  • Volume
    37
  • Issue
    12
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    2558
  • Lastpage
    2563
  • Abstract
    Mixed metal matrix cathodes (MM-cathodes) were optimized and their life behavior was tested in different test vehicles. In two separate life test programs, 57 MM-cathodes with a W/Os matrix were investigated in test vehicle (tetrodes) where the cathode environment was similar to that of a tube. In parallel, a further 100 MM-cathodes in other types of test vehicles were operated for supplementary investigations and cathode design optimization. The operational temperatures were between 880°C B and 1200°CB (brightness). One group of cathodes was operated at constant anode voltage with an initial current density of 0.75 A/cm2, and the other group was operated with a loading of 2 A/cm2 for as long as the anode voltage could be adjusted. The cathodes at lower temperatures (⩽1100°CB ) have accumulated more than 40000 h of operation. The results are used to establish cathode life prediction models as a function of temperature and current density. The excellent capability of the cathode type for long-life space applications has been demonstrated
  • Keywords
    life testing; thermionic cathodes; travelling-wave-tubes; 880 to 1200 degC; TWT; anode voltage; brightness; cathode design optimization; cathode environment; cathode life prediction models; current density; emission current; life test programs; loading; long-life space applications; mixed metal matrix cathodes; operational temperatures; test vehicles; tetrodes; Anodes; Brightness; Cathodes; Current density; Design optimization; Life testing; Predictive models; Temperature; Vehicles; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.64532
  • Filename
    64532