• DocumentCode
    1523106
  • Title

    Design and Sensitivity Analysis of a New Current-Mode Sense Amplifier for Low-Power SRAM

  • Author

    Do, Anh-Tuan ; Kong, Zhi-Hui ; Yeo, Kiat-Seng ; Low, Jeremy Yung Shern

  • Author_Institution
    Center for Integrated Circuits & Syst. (CICS), Nanyang Technol. Univ., Singapore, Singapore
  • Volume
    19
  • Issue
    2
  • fYear
    2011
  • Firstpage
    196
  • Lastpage
    204
  • Abstract
    A new current-mode sense amplifier is presented. It extensively utilizes the cross-coupled inverters for both local and global sensing stages, hence achieving ultra low-power and ultra high-speed properties simultaneously. Its sensing delay and power consumption are almost independent of the bit- and data-line capacitances. Extensive post-layout simulations, based on an industry standard 1 V/65-nm CMOS technology, have verified that the new design outperforms other designs in comparison by at least 27% in terms of speed and 30% in terms of power consumption. Sensitivity analysis has proven that the new design offers the best reliability with the smallest standard deviation and bit-error-rate (BER). Four 32 × 32-bit SRAM macros have been used to validate the proposed design, in comparison with three other circuit topologies. The new design can operate at a maximum frequency of 1.25 GHz at 1 V supply voltage and a minimum supply voltage of 0.2 V. These attributes of the proposed circuit make it a wise choice for contemporary high-complexity systems where reliability and power consumption are of major concerns.
  • Keywords
    CMOS digital integrated circuits; SRAM chips; amplifiers; current-mode circuits; error statistics; integrated circuit reliability; low-power electronics; network synthesis; BER; CMOS technology; SRAM macros; bit-error-rate; bit-line capacitance; circuit topologies; cross-coupled inverters; current-mode sense amplifier; data-line capacitance; global sensing stage; local sensing stage; low-power SRAM; power consumption; reliability; sensing delay; size 65 nm; ultrahigh-speed properties; voltage 1 V; Current mode and sense amplifier; low power; low voltage SRAM;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2033110
  • Filename
    5299034