DocumentCode :
1523213
Title :
Investigation of Sc2O3 behavior in Sc2 O3-dispersed oxide cathodes
Author :
Saito, Masato ; Suzuki, Ryo ; Fukuyama, Keiji ; Watanabe, Keiji ; Sano, Kinjiro ; Nakanishi, Hisano
Author_Institution :
Mitsubishi Electr. Corp., Kanagawa, Japan
Volume :
37
Issue :
12
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
2605
Lastpage :
2611
Abstract :
Sc2O3 behavior in oxide cathodes is investigated through the analyses of AES, XPS, and EPMA. It has been shown that Sc2O3 plays a significant role in maintaining higher surface concentration of Ba atoms. Thermochemical considerations have indicated possible reactions of Sc2O3 with interface compounds. It is concluded that Sc2O3 decomposes interface compounds and generates more Ba atoms in the vicinity of a base metal, and Sc2 O3 inside of an electron emissive layer also has an effect on reducing surface Ba evaporation and maintaining higher electric conductivity
Keywords :
Auger effect; X-ray photoelectron spectra; electron probe analysis; oxide coated cathodes; scandium compounds; surface chemistry; thermionic cathodes; AES; Ba atoms; EPMA; Sc2O3 behavior; Sc2O3-dispersed oxide cathodes; XPS; electric conductivity; electron emissive layer; interface compounds; surface Ba evaporation; surface concentration; thermochemistry; Atomic layer deposition; Brightness; Cathodes; Conductivity; Current density; Electrons; Powders; Spraying; Strontium; Temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.64548
Filename :
64548
Link To Document :
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