Title :
Introduction to the 2000 Bipolar/BiCMOS Circuits and Technology Meeting
Author :
de Vreede, Leo C. N.
Author_Institution :
Delft University of Technology
Keywords :
BiCMOS integrated circuits; Bipolar transistors; Breakdown voltage; Current measurement; Doping; Electrostatic discharge; Linearity; Meetings; Paper technology; Stress;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2001.944665
