• DocumentCode
    1523233
  • Title

    Introduction to the 2000 Bipolar/BiCMOS Circuits and Technology Meeting

  • Author

    de Vreede, Leo C. N.

  • Author_Institution
    Delft University of Technology
  • Volume
    36
  • Issue
    9
  • fYear
    2001
  • Firstpage
    1371
  • Lastpage
    1372
  • Keywords
    BiCMOS integrated circuits; Bipolar transistors; Breakdown voltage; Current measurement; Doping; Electrostatic discharge; Linearity; Meetings; Paper technology; Stress;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2001.944665
  • Filename
    944665
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1523233