DocumentCode
1523244
Title
Full-wave analysis of lossy quasi-planar transmission line incorporating the metal modes
Author
Tzuang, Ching-Kuang C. ; Chen, Chu-Dong ; Peng, Song-tsuen
Author_Institution
Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
38
Issue
12
fYear
1990
fDate
12/1/1990 12:00:00 AM
Firstpage
1792
Lastpage
1799
Abstract
The authors present a novel full-wave mode-matching approach to accurately analyze the dispersion characteristics of millimeter-wave and microwave transmission lines with finite conductivity, metallization thickness, and holding grooves. The approach is quite general, but only the results for a unilateral finline are presented. The accuracy of the solution depends primarily on the correct and complete description of eigenfunction expansions in each of the uniform (stratified) or nonuniform layer regions. The latter consists of metallized strips of finite conductivity, which in turn produce the so-called metal modes (eigenmodes). The metal mode exists in the metallized region with high conductivity for the most part and decays sharply in the air region. Without incorporating the metal modes, the convergence studies will fail and the accuracy of the field theory solution deteriorates. Since the accuracy of the proposed approach is established, the composite effects of the finite conductivity and metallization thickness can be studied rigorously
Keywords
dispersion (wave); eigenvalues and eigenfunctions; fin lines; strip lines; waveguide theory; dispersion characteristics; eigenfunction expansions; finite conductivity; finite metallisation thickness; full-wave mode-matching; holding grooves; lossy quasiplanar line; metal modes; microwave transmission lines; millimeter-wave; quasi-planar transmission line; unilateral finline; Conducting materials; Conductivity; Dielectric losses; Finline; Metallization; Microstrip; Millimeter wave technology; Propagation losses; Transmission line theory; Transmission lines;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.64558
Filename
64558
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