A rigorous dispersive characterization of microstrip cross and T junctions

Author

Wu, Shih-Chang ; Yang, Hung-Yu ; Alexopoulos, Nicolaos G. ; Wolff, Ingo

Author_Institution

Dept of Electr. Eng., California Univ., Los Angeles, CA, USA

Volume

38

Issue

12

fYear

1990

fDate

12/1/1990 12:00:00 AM

Firstpage

1837

Lastpage

1844

Abstract

A full-wave spectral-domain analysis is applied to the characterization of multiport microstrip discontinuities. This method uses the moment method to find the currents in the microstrip circuits and subsequently the scattering parameters of the junctions. In this approach, all the physical effects are considered, including radiation and surface waves. The numerical results for a T- and a cross-junction are presented and agree well with the quasi-static values at low frequencies. The S-parameters of a T-junction are further compared with the measured results, with excellent agreement. The utilization of a shaped T-junction as a broadband equal-power divider is also discussed

Keywords

S-parameters; dispersion (wave); strip line components; S-parameters; T junctions; broadband equal-power divider; dispersive characterization; full-wave spectral-domain analysis; microstrip circuits; moment method; multiport microstrip discontinuities; radiation; scattering parameters; surface waves; Dispersion; Feeds; Integral equations; Microstrip; Microwave circuits; Moment methods; Scattering parameters; Surface waves; Transmission line discontinuities; Waveguide discontinuities;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.64564

Filename

64564