DocumentCode :
1523512
Title :
Approach to Fault Identification for Electronic Products Using Mahalanobis Distance
Author :
Kumar, Sachin ; Chow, Tommy W S ; Pecht, Michael
Author_Institution :
Center for Adv. Life Cycle Eng. (CALCE), Univ. of Maryland, College Park, MD, USA
Volume :
59
Issue :
8
fYear :
2010
Firstpage :
2055
Lastpage :
2064
Abstract :
This paper presents a Mahalanobis distance (MD) based diagnostic approach that employs a probabilistic approach to establish thresholds to classify a product as being healthy or unhealthy. A technique for detecting trends and biasness in system health is presented by constructing a control chart for the MD value. The performance parameters´ residuals, which are the differences between the estimated values (from an empirical model) and the observed values (from health monitoring), are used to isolate parameters that exhibit faults. To aid in the qualification of a product against a specific known fault, we suggest that a fault-specific threshold MD value be defined by minimizing an error function. A case study on notebook computers is presented to demonstrate the applicability of this proposed diagnostic approach.
Keywords :
electronic products; fault diagnosis; notebook computers; probability; Mahalanobis distance based diagnostic approach; electronic products; error function minimization; fault identification; fault-specific threshold MD value; notebook computers; probabilistic approach; Computers; Mahalanobis distance (MD); diagnostics; electronic products; fault identification; fault isolation;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2009.2032884
Filename :
5299092
Link To Document :
بازگشت