Title :
Interferometer profile extraction using continuous wavelet transform
Author :
Watkins, L.R. ; Tan, S.M. ; Barnes, T.H.
Author_Institution :
Dept. of Phys., Auckland Univ.
fDate :
12/4/1997 12:00:00 AM
Abstract :
The continuous wavelet transform may be used to accurately reconstruct surface profiles from two sets of Fizeau interferometer fringe data. In contrast to standard phase-stepping methods, the data may have any arbitrary phase-step between 0 and π. The method enables considerable simplification of the measurment apparatus and yields accurate profiles, even in the presence of noise
Keywords :
light interferometry; measurement by laser beam; surface topography measurement; wavelet transforms; Fizeau interferometer fringe data; continuous wavelet transform; interferometer profile extraction; measurment apparatus simplification; surface profile reconstruction;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19971474
