• DocumentCode
    1523575
  • Title

    Broad-band microwave measurements with transient radiation from optoelectronically pulsed antennas

  • Author

    Arjavalingam, G. ; Pastol, Yvon ; Halbout, Jean- Marc ; Kopcsay, Gerard V.

  • Author_Institution
    IBM, Yorktown Heights, NY, USA
  • Volume
    38
  • Issue
    5
  • fYear
    1990
  • fDate
    5/1/1990 12:00:00 AM
  • Firstpage
    615
  • Lastpage
    621
  • Abstract
    A broadband microwave measurement technique based on picosecond transient radiation from optoelectronically pulsed antennas is described. It is performed with exponentially tapered coplanar stripline antennas which are integrated with the photoconductive devices used for ultrafast pulse generation and sampling. The signal analysis required for deriving the desired physical properties from the measured time-domain waveforms is discussed. This is a coherent technique that independently determines both the real and the imaginary parts of the dielectric constants of materials, from 10 to 130 GHz, in a single experiment. Some representative results are presented
  • Keywords
    dielectric loss measurement; microwave antennas; microwave measurement; optoelectronic devices; permittivity measurement; photoconducting devices; 10 to 130 GHz; EHF; broadband microwave measurement technique; coherent technique; complex permittivity measurement; dielectric constants; exponentially tapered coplanar stripline antennas; imaginary parts; microwave permittivity measurement; optoelectronically pulsed antennas; photoconductive devices; picosecond transient radiation; real parts; representative results; single experiment; time-domain waveforms; ultrafast pulse generation; ultrafast sampling; Antenna measurements; Broadband antennas; Measurement techniques; Microwave antennas; Microwave devices; Microwave measurements; Microwave theory and techniques; Photoconducting devices; Pulse measurements; Stripline;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.54930
  • Filename
    54930