• DocumentCode
    1523624
  • Title

    Construction of the Magnetic Phase Diagram of FeMn/Ni/Cu(001) Using Photoemission Electron Microscopy

  • Author

    Wu, J. ; Scholl, A. ; Arenholz, E. ; Hwang, Chanyong ; Qiu, Z.Q.

  • Author_Institution
    Nat. High Magn. Field Lab., Florida State Univ., Tallahassee, FL, USA
  • Volume
    47
  • Issue
    6
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    1631
  • Lastpage
    1634
  • Abstract
    Single crystalline FeMn/Ni bilayer was epitaxially grown on Cu(001) substrate and investigated by photoemission electron microscopy (PEEM). The FeMn and Ni films were grown into two cross wedges to facilitate an independent control of the FeMn (0-20 ML) and Ni (0-20 ML) film thicknesses. The Ni magnetic phases were determined by Ni domain images as a function of the Ni thickness (dNi) and the FeMn thickness (dFeMn). The result shows that as the Ni thickness increases, the Ni film undergoes a paramagnetic-to-ferromagnetic state transition at a critical thickness of dFM and an in-plane to out-of-plane spin reorientation transition at a thicker thickness dSRT. The phase diagram shows that both dFM and dSRT increase as the FeMn film establishes its antiferromagnetic order.
  • Keywords
    antiferromagnetism; copper; ferromagnetic-paramagnetic transitions; iron alloys; magnetic domains; manganese alloys; metallic thin films; nickel; photoelectron microscopy; spin dynamics; substrates; Cu; Cu(001) substrate; FeMn-Ni; Ni domain images; Ni magnetic phases; PEEM; antiferromagnetic order; critical thickness; film thickness; magnetic phase diagram; paramagnetic-to-ferromagnetic state transition; photoemission electron microscopy; single crystalline FeMn-Ni bilayer; spin reorientation transition; Frequency modulation; Magnetic domains; Magnetic multilayers; Magnetic resonance imaging; Nickel; Perpendicular magnetic anisotropy; Magnetic domains; magnetic layered films;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2106768
  • Filename
    5772194