• DocumentCode
    1523628
  • Title

    Periodic-structure photoexcitation of a silicon coplanar waveguide for selective optoelectronic microwave control

  • Author

    Platte, Walter

  • Author_Institution
    Inst. fuer Hochfrequenztech., Erlangen-Nuernberg Univ., West Germany
  • Volume
    38
  • Issue
    5
  • fYear
    1990
  • fDate
    5/1/1990 12:00:00 AM
  • Firstpage
    638
  • Lastpage
    646
  • Abstract
    Presented is a detailed analysis of the microwave Bragg-reflection characteristics of a periodically continuous-wave (CW) photoexcited coplanar waveguide on silicon substrate, with special regard to the inherent carrier diffusion mechanisms. In particular, the carrier diffusion in the direction of wave propagation can strongly affect the stopband reflection spectra of the configuration with respect to magnitude and bandwidth or with respect to efficiency and selectivity. The dominant effects are studied quantitatively and are outlined in the form of practical performance diagrams. Future application of periodically photoexcited transmission line sections for light-induced tunable filters or Bragg reflectors can be inferred. Initial experimental results from a three-section periodic structure of 17-GHz-center frequency under 840-nm light emitting diode (LED) CW excitation are reported
  • Keywords
    diffusion in solids; elemental semiconductors; photoconductivity; silicon; waveguide theory; Si; carrier diffusion mechanisms; efficiency; light emitting diode; light-induced tunable filters; microwave Bragg-reflection characteristics; performance diagrams; periodically photoexcited transmission line sections; photoexcited coplanar waveguide; selective optoelectronic microwave control; stopband reflection spectra; three-section periodic structure; Bandwidth; Coplanar waveguides; Filters; Light emitting diodes; Microwave propagation; Optical propagation; Optical reflection; Periodic structures; Silicon; Transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.54933
  • Filename
    54933