Concurrent test for digital linear systems

Author

Bayraktaroglu, Ismet ; Orailoglu, Alex

Author_Institution

Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA

Volume

20

Issue

9

fYear

2001

fDate

9/1/2001 12:00:00 AM

Firstpage

1132

Lastpage

1142

Abstract

Invariant-based concurrent test schemes can provide economical solutions to the problem of concurrent error detection. An invariant-based concurrent error-detection scheme for linear digital systems is proposed. The cost of concurrent error-detection hardware is appreciably reduced due to utilization of a time-extended invariant, which extends the error-checking computation over time and, thus, reduces hardware requirements. Error-detection capabilities of the scheme proposed in this work are analyzed and conditions on the implementation for achieving complete fault coverage are outlined. Implementations fulfilling such conditions have been shown through experiments to provide 100% concurrent fault detection

Keywords

VLSI; concurrent engineering; digital integrated circuits; error detection; integrated circuit testing; VLSI circuit; concurrent error detection; concurrent testing; digital linear system; fault coverage; time-extended invariant; Circuit testing; Costs; Delay; Digital systems; Fault detection; Fault tolerance; Hardware; Linear systems; System testing; Very large scale integration;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.945308

Filename

945308